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Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors

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Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors

Brand Name : BOTO

Model Number : BT-H-2273

Certification : CE ISO

Place of Origin : China

MOQ : 1set

Price : Negotiated

Payment Terms : L/C, T/T

Supply Ability : 100 Set/Sets per Month

Delivery Time : 1-15 days,to be negotiated

Packaging Details : standard wooden cases

Power supply : 1 ph 3 Lines ,50/60HZ ;

Operating temperature : 121℃; 132℃; (143℃ special selection)

Temperature Range : 100~135℃

Standard : IEC60068-2-66 ets

Protect : Water short storage

Steam Pressure : 3.0Kg/cm2

Sample Shelf : Two layers

Circulation method : Natural convection circulation of water vapor

Operating humidity : 100%RH saturated steam humidity

Accessories : Three-layer stainless steel partition

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Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors

Product Description
Scope of application PCT high-voltage accelerated aging test equipment is suitable for the sealing performance of defense, aerospace, automotive parts, electronic parts, plastics, magnet industries, pharmaceuticals, circuit boards, multilayer circuit boards, IC, LCD, magnets, lighting, lighting products and other products Testing, related products for accelerated life test, used in the product design stage, used to quickly expose product defects and weaknesses. Test the wear resistance and air tightness of its products
Meet the test standard Can meet IEC60068-2-66, JESDEC-A110, A118, IEC60068-2-66, JESDEC A110, A118
High Accelerated Stress Test Chamber Simulation Climate Features 1. The dual-circuit structure of imported high temperature solenoid valve is adopted, which reduces the use failure rate to the greatest extent. 2. Separate steam generation room to avoid direct impact of steam on the product, so as not to cause partial damage to the product. 3. The labor-saving structure of the door lock solves the shortcomings of difficult locking of the disc handle of the first generation product. 4. Exhaust cold air before the test; the design of cold air exhaust during the test (exhaust the air in the test barrel) improves pressure stability and reproducibility. 5. Ultra-long-lasting experimental operation time, 400 hours for the machine to run for a long time. 6. Water level protection, through the water level Sensor in the test room to detect and protect. 7. Tank pressure resistance design, the tank body pressure resistance (140t)) 2.65kg, in line with the water pressure test 6kg. 8. Two-stage pressure safety protection device adopts a two-stage combination controller and mechanical pressure protection device. 9. Two-stage automatic pressure-relief button for safety protection and emergency safety device.
Size Information
model
PCT-30
PCT-35
PCT-35
Internal dimensions (WxHxD) mm
300x500
340x500
400×500
Operating temperature
121°C; 132°C; (143°C special selection)
Use vapor pressure (absolute pressure)
1 ambient atmospheric pressure +0.0Kg/cm2-2.0Kg/cm2; (3.0Kg/cm2ffl in special specifications)
Circulation method
Natural convection circulation of water vapor
Safety protection device
Water shortage protection, overpressure protection, (with automatic/manual water replenishment function, automatic pressure relief function)
Accessories
Three layers of stainless steel clapboard
Operating humidity
100%RH saturated steam humidity
Power supply
AC220V, 50/60Hz/
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Detailed Images
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Manufacture Specification
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors
Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors

Product Tags:

Accelerated Pressure Aging Test Machine

      

IC Semiconductors PCT Chamber

      

Environmental Test PCT Chamber

      
Wholesale Highly Accelerated Pressure Aging Test Machine PCT Test Chamber For IC Semiconductors from china suppliers

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